Mar 5, 2007
Impressive Recent Progress in Nanotechnology
Posted by Michael Anissimov in category: nanotechnology
A better atomic force microscope from Japan:
Credit: Oscar Custance, Osaka University
“A new type of atomic force microscope (AFM) has been developed that can “fingerprint” the chemical identity of individual atoms on a material’s surface. This is one step ahead of existing AFMs, which can only detect the position of atoms. The device determines local composition and structure using a precise calibration method, and can even be used to manipulate specific atomic species. The team demonstrated their “fingerprinting” technique by using an atomic force microscope (AFM) to distinguish atoms of tin (blue) and lead (green) deposited on a silicon substrate (red).”
Continue reading “Impressive Recent Progress in Nanotechnology” »